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Description

DDESP-FM-V26 N m, 105 kHz, Conductive Doped Diamond Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker DDESP FM V2 Electrical Probes Providing consistent performance and high sensitivity. Bruker's new conductive diamond coated probe provides high performance Scanning Spreading Resistance Microscopy (SSRM)and Piezoresponse Force Microscopy (PFM) to characterize advanced semiconductor devices, Microelectromechanical Systems (MEMS), and

Long shelf life and reliability at any laser power (solid gold)

REQUIRES NanoScope V8

High resolution electrical imaging with a sharp conductive tip

Tip Geometry: Critical Dimension (Overhang) Tip Height: 10 - 20 Tip Set Back( RNG): 5 - 15 Tilt Compensation: cell2

For general imaging

The Aluminum reflective coating on the backside of the cantilever increases the laser signal (A+B) by up to 2

180nm step height

The unique design of these probes renders a balance of high resonant frequency and low spring constant

Built on the high-performance RESP-10 AFM probe

4-Sided Tip

3 cantilevers: 0

Bruker AFM Probes has introduced an improved version of its popular