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Description

TEM/FIB Grid Pin Stub, SingleDESCRIPTION Accepts one standard 3mm TEM or FIB grid for easy inspection of film coverage and sample attachment by SEM. Diameter of holder is 12. 4mm (0. 49"), pin length is 6mm (0. 24"). Prod # Description Unit 15492 TEM FIB Grid Pin Stub, Single each

Hole Width 205µm

64" x 2" x 0

Cantilever Thickness (Nom): 3 Cantilever Thickness (RNG): 2

12 x 12 x 14mm H

the PELCO easiGlow™ uses an automated and quick cycle with fully selectable parameters

Strong Fine Serrated Tips & Grips 648 155mm NM-SS 0

mission Mark Center Rim G50 500 420 80 70 - - G75 340 285 55 66 • • G100 250 205 45 67 • • G100HEX 250 220 30 77 - - G150 165 125 40 45 • • G150HEX 165 130 35 62 - • G200 125 90 35 52 • • G200HEX 125 105 20 70 - - G200HH 125 113 12 82 - • G200HS 125 113 12 82 - • G300 83 58 25 49 • • G300HS 83 73 10 77 - • G300HEX 83 58 25 49 - • G300HH 83 73 10 77 - • G400 62 37 25 37 • • G400HS 62 54 8 76 - • G400HEX 62 37 25 36 - • G400HH 57 49 8 74 • • G400P 62 40 22 65 - • G600TT - 30 10/16 - • - G600HH 37 29 8 61 • • G600HHS 42 37 5 78 - • G600HSS 42 37 5 78 - • G1000HS 25 19 6 57 - • G1000HH 25 19 6 57 - • G1500HS 16

Replacement Tips 5 PVDF 0

There is sufficient usable area to make tens of thousands of measurements without reusing any areas contaminated or altered by previous scans

making them more prone to breaking if stressed

Microelectromechanical Systems (MEMS)

Innova probe cartridge for STM Mode DESCRIPTION

Exchange/Return Notes